Self-contained, image-based dot meter for halftone measurement of CTP and all other plate, film, and color print materials.
ULTRA DOTTIE
Self-contained, image-based dot meter for halftone measurement of CTP and
all other plate, film, and color print materials. Graphical display with
screen angle, dot diameter and ruling calculation. Calibration data plotted
directly on the display. Store and download images and data for analysis,
linearization, etc.
The Beta Ultra Dottie is the most advanced, accurate, and easy-to-use halftone
image analyzer on the market. Operating at more than twice the resolution
of any portable instrument, the 12,000 dpi imager easily measures conventional
halftone screens in excess of 400 lines/inch, and stochastic pixels smaller
than 20 microns. The LED illuminator uses 15 monochromatic elements to provide
perfectly uniform and non-directional color separation illumination, eliminating
directional effects as a potential source of measurement error.
Eliminating the most power-hungry component
of conventional imagers, the troublesome CCD (charge coupled device) has
been replaced by a high resolution CMOS (complimentary metal oxide semiconductor)
chip. Combining the advantages of low power consumption and wide dynamic
range the CMOS chip raises the bar on halftone analyzers.
Aggressive power management software and low-power design are combined to
give over half a million measurements on "AA" alkaline batteries.
No battery charger will ever get lost, damaged, or forgotten with the Ultra
Dottie. It doesn't have one or need one.
A sample is measured in less than 2 seconds and analyzed for dot area, screen
ruling, screen angle, and dot diameter. A full resolution image; one imager
pixel mapped to each display pixel, is displayed at the touch of a button.
Calibration series targets are automatically displayed as a deviation plot
as well as tabular data ON SCREEN, no computer or RIP download needed.
The most important advantage of CMOS halftone image analysis is the elimination
of optical dot gain effects. It is no longer necessary to determine dot
area from average reflectance measurements. Image analysis sees the dots
and measures them directly.